FOZILJONOV MIRZABAXROM BAXTIYORJON O’G’LI; RAXMONKULOVA NARGIZAXON BAXROMJON QIZI. LOCALIZED OXIDE TRAPPED CHARGE’S EFFECT ON THE CAPACITANCE BETWEEN GATE-SOURCE IN FINFET DEVICES. World Scientific Research Journal, [S. l.], v. 40, n. 2, p. 131–136, 2025. Disponível em: https://scientific-jl.com/wsrj/article/view/22495. Acesso em: 25 jun. 2025.